ECE Seminar Speaker: Dr. Yuchang MoDate(s): 4/5/2013 2:00 PM - 4/5/20133:30 PM
Location: Lester W. Cory Conference Room, SENG - Room 213A
Contact: Honggang Wang email@example.com 508-999-8469
Topic: “New Development on MDD-Based Reliability Analysis”
Speaker: Dr. Yuchang Mo
Zhejiang Normal University (ZJNU), China
Department of Electrical and Computer Engineering
University of Massachusetts Dartmouth
Multi-valued decision diagrams (MDD) have recently been proposed to address the reliability analysis of complex multi-state systems. In this talk I will present our recent development on applying the MDD-based approach to the reliability analysis of phased-mission systems (PMS), which are systems involving multiple, consecutive and non-overlapping phases of operation. Both single-mode and multi-mode failures are considered. Furthermore, the MDD-based solutions are presented for analyzing systems subject to dependent common-cause failures. As compared with the traditional methods, the MDD-based solutions require less computer storage and are more computationally efficient. Several case studies will be presented.
Yuchang Mo received the B.E. (2002), M.S. (2004) and Ph.D. (2008) degrees in Computer Science from Harbin Institute of Technology, Harbin, China. He is an Associate Professor with the Department of Computer Science and Technology, Zhejiang Normal University (ZJNU), Jinhua, China, and the Director of the Dependable Computing Lab in the College of Mathematics, Physics and Information Engineering at ZJNU. He is currently a Visiting Scholar with the Department of Electrical and Computer Engineering, University of Massachusetts (UMass) Dartmouth, North Dartmouth. Dr. Mo has published papers in the IEEE Transactions on Reliability, Reliability Engineering and System Safety, Quality and Reliability Engineering International, and others. His research has been supported by the National Science Foundation of China and Zhejiang Province, and Sci & Tech Development Plan of Zhejiang Province. His research interests include dependable computing and networking, fault tolerant computing, and reliability analysis of complex systems and networks using combinatorial models.